As stated in this question: Antiresonance of multiple parallel decoupling capacitors: use same value or multiple values? I have been curious to the real-world effects of different capacitors and their frequency responses. Using Spice with a small signal analysis is easy to do, but it really can't be replicated on a real board to my knowledge.
If I wanted to take a board, put a high speed IC on it with it clocked at a high frequency to test various decoupling capacitor schemes, what would be the best way to quantitatively see results? I see a few options:
- Check the ripple voltage on the input supply to the IC. This would show how well the decoupling caps are able to supply the IC with high F voltage spikes. The issue is measuring the AC on top of the DC is not easy to do with a normal scope setup. See here: https://www.tek.com/blog/a-better-method-for-analyzing-ripple-on-power-rails It would require a high bandwidth scope and high cost probes.
- Use a spectrum analyzer to see the frequency content on the power rail. Similar to how conducted emissions would be checked. I really don't know much about this method, so I'm not sure it it would work.
- Use a spectrum analyzer to check the radiated emissions from the PCB. This would work, but requires a very noise free environment which I don't know if I can do.
Ultimately, I don't need to achieve a real-world comparison with any standard. I just need a quantitative value to compare one board to another, with the only difference being the decoupling scheme.